Nanowire field-effect transistor

被引:18
|
作者
Wernersson, Lars-Erik
Lind, Erik
Samuelson, Lars
Lowgren, Truls
Ohlsson, Jonas
机构
[1] Lund Univ, S-22100 Lund, Sweden
[2] QuMat Technol AB, S-22224 Lund, Sweden
关键词
nanowire; InAs; wrap gate; transistor; MISFET;
D O I
10.1143/JJAP.46.2629
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new processing scheme for the fabrication of sub-100-nm-gate-length vertical nanowire transistors has been developed. InAs transistors with an 11 x 11 nanowire matrix and 80 nm gate length have been realized by this process. The gate length is directly controlled via the thickness of the evaporated gate metal and is thus easily scalable. The demonstrated devices operate in depletion mode, and they show a maximum drive current of about 1 mA and a maximum transconductance of 0.52 mS at V-g = -0.5 V and V-d = 1 V.
引用
收藏
页码:2629 / 2631
页数:3
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