Structural and Magnetic Properties of CoO/Co Thin Films Deposited Onto Self-Assembled Polystyrene Nanospheres (600nm)

被引:0
|
作者
Kumar, Y. [1 ]
Tripathi, J. [2 ]
Kumar, D. [3 ]
Gupta, P. [4 ]
Tripathi, S. [5 ]
Sharma, A. [1 ]
机构
[1] Manipal Univ Jaipur, Dept Phys, Jaipur, Rajasthan, India
[2] IPS Acad, Dept Phys, ISLE, Indore, India
[3] UGC DAE Consortiums Sci Res, Indore, India
[4] Raja Ramanna Ctr Adv Technol, Synchrotrons Utilizat Sect, Indore, Madhya Pradesh, India
[5] Bhabha Atom Res Ctr, Atom & Mol Phys Div, Mumbai, Maharashtra, India
来源
关键词
SOLID-STATE REACTION; SURFACE-ROUGHNESS; THICKNESS;
D O I
10.1063/5.0016713
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The structural and magnetic properties of CoO/Co nanocaps prepared by electron beam evaporation technique as a function of Cothickness [ultra-thin (10 nm) and thick (100 nm)] films are presented. These films were deposited on PS (Polystyrene) nanospheres (600nm diameter) self-assembled on Si (100) substrate through nanosphere lithography. For a comparative study, these films were also deposited on plane Si substrateunder same deposition conditions. While Scanning electron microscopy showed the morphology and uniform distribution of nanospheres, corresponding roughness and thickness of the thin films on bare substrate were calculated using X-ray reflectivity technique. in which changes in XRR oscillations with film thickness have been observed. Magnetic properties were investigated using magneto optical Kerr effect which show enhancement in coercivity with increase in film thickness. The results are interpreted in terms of nanosphere curvature resulting in the variation in film thickness across this curvature.
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页数:4
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