Process capability evaluation for the process of product families

被引:15
|
作者
Chen, K. S. [1 ]
Huang, M. L. [1 ]
机构
[1] Natl Chin Yi Inst Technol, Dept Ind Engn & Management, Taichung 411, Taiwan
关键词
process capability index; process yield; product family;
D O I
10.1007/s11135-005-6223-7
中图分类号
C [社会科学总论];
学科分类号
03 ; 0303 ;
摘要
Process capability analysis is a highly effective means of assessing the process ability of manufacturing product that meets specifications. A larger process capability index (PCI) implies a higher process yield, and lower expected process loss. Many PCIs have been effectively and widely used to determine whether the quality of a process meets preset targets. However, those existing PCI cannot be applied to evaluate the process capability of a process producing a product family. This work presents a novel PCI (C-pm(T)) which takes into account all family members and obtains the probability density function for the PCI for a product family. The relationship between the PCI and process yield is described. An example is provided to demonstrate the methodology for practical application.
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页码:151 / 162
页数:12
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