Phase determination of x-ray reflection coefficients

被引：28

作者：

Zimmermann, KM ^{[1
]}

Tolan, M ^{[1
]}

Weber, R ^{[1
]}

Stettner, J ^{[1
]}

Doerr, AK ^{[1
]}

Press, W ^{[1
]}

机构：

[1] Univ Kiel, Inst Expt & Angew Phys, D-24098 Kiel, Germany

来源：

PHYSICAL REVIEW B | 2000年 / 62卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.62.10377

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

It is shown to what extent the phase of a reflection coefficient may be determined from a single x-ray reflectivity experiment. Complex calculus guarantees that the so-called "phase problem" is relaxed for certain situations and the reflection coefficient is only determined by its moduls. A procedure to reconstruct the phase from a single measurement under incorporation of preknowledge of the system is derived and tested by numerical examples.

引用

页码：10377 / 10382

页数：6

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