共 50 条
- [1] DIRECT DETERMINATION OF X-RAY REFLECTION PHASES FOR NONCENTROSYMMETRIC CRYSTALS[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 37 (01): : 57 - 64CHANG, SLVALLADARES, JAP
- [2] DIRECT EXPERIMENTAL-METHOD FOR THE DETERMINATION OF X-RAY REFLECTION PHASES[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1981, 26 (04): : 221 - 226CHANG, SL
- [3] Direct measurements of Bragg-reflection phases in x-ray crystallography[J]. PHYSICAL REVIEW B, 1999, 59 (17): : 11109 - 11112Shen, Q
- [4] DIRECT DETERMINATION OF X-RAY REFLECTION PHASE RELATIONSHIPS THROUGH SIMULTANEOUS REFLECTION[J]. PHYSICAL REVIEW LETTERS, 1961, 7 (04) : 120 - &HART, MLANG, AR
- [5] Determination of x-ray reflection phases using N-beam diffraction[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1998, 54 : 886 - 894Chang, SL
- [6] X-ray reflection phases and dynamical diffraction effects[J]. CHINESE JOURNAL OF PHYSICS, 1997, 35 (06) : 896 - 902Chang, SL
- [7] DIRECT DETERMINATION OF THE PHASE OF THE REFLECTION AMPLITUDE BY MEANS OF STANDING X-RAY WAVES[J]. JETP LETTERS, 1989, 49 (11) : 726 - 730VARTANYANTS, IAKOVALCHUK, MVKON, VGNIKOLAENKO, AMKHARITONOV, IY
- [8] Phase determination of x-ray reflection coefficients[J]. PHYSICAL REVIEW B, 2000, 62 (15) : 10377 - 10382Zimmermann, KMTolan, MWeber, RStettner, JDoerr, AKPress, W
- [9] Multiple-beam X-ray diffraction for physical determination of reflection phases and its applications[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1997, 53 : 108 - 143Weckert, EHummer, K
- [10] Multiple-beam X-ray diffraction for physical determination of reflection phases and its applications[J]. Acta Crystallographica, Section A: Foundations of Crystallography, 1997, 53 (pt 2):Weckert, E.Hummer, K.