CHARACTERISATION OF SICF/SIC SPECIMENS USING AN IN-SITU TENSILE STAGE WITHIN A SCANNING ELECTRON MICROSCOPE

被引：0

作者：

Jordan, Steven P. ^{[1
]}

Bache, Martin R. ^{[1
]}

Newton, Christopher D. ^{[1
]}

Gale, Louise ^{[2
]}

机构：

[1] Swansea Univ, Coll Engn, Inst Struct Mat, Bay Campus, Swansea SA1 8EN, W Glam, Wales

[2] Rolls Royce Plc, POB 31, Derby DE24 8BJ, England

来源：

PROCEEDINGS OF THE ASME TURBO EXPO: TURBOMACHINERY TECHNICAL CONFERENCE AND EXPOSITION, 2019, VOL 6 | 2019年

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

The present paper will introduce the use of scanning electron microscope based, in-situ tensile testing as a method of detecting cracking in a SiCf/SiC CMC at room temperature. Small scale tensile specimens were prepared, but still sampling multiple longitudinal and transverse fibre tows. Monotonic loading was applied to initiate cracking, whilst contemporary time lapse imaging and retrospective digital image correlation recorded the development of these cracks at the specimen surface. Examples of strain localization, crack initiation and propagation will be presented for a plain gauge section specimen and single edge notched specimen. The critical combination of SEM imaging together with real time loading, in order to identify microscopic cracking in this CMC system, will be demonstrated.

引用

页数：8

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