Diagnostics and growth of organic thin films for electro-optic modulators with low driving voltage

被引：0

作者：

Liu, ZF ^{[1
]}

Sarkisov, SS ^{[1
]}

Curley, MJ ^{[1
]}

Leyderman, A ^{[1
]}

Cui, YL ^{[1
]}

Li, JW ^{[1
]}

Penn, B ^{[1
]}

机构：

[1] Alabama A&M Univ, Dept Phys, Normal, AL 35762 USA

来源：

OPTICAL DEVICES AND DIAGNOSTICS IN MATERIALS SCIENCE | 2000年 / 4098卷

关键词：

single crystal organic films; electro-optic materials; electro-optic modulators;

D O I：

10.1117/12.401644

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The focus of this paper is the characterization of electro-optic properties of single crystal thin films of organic material NPP grown by the plate-guided method. Characterization was performed using the longitudinal a.c. modulation technique. Half- wave voltage V-pi, figure-of-merit F, and electra-optic coefficient r(63) were estimated to be 3.24 kV, 0.98x10(-10) m/V and 25.8x10(-12) m/V respectively. We found that crystalline z-axis is off the normal to the plane of the film at an angle of 7(0). We also proposed a transverse version of a thin film electro-optic modulator with low driving voltage, which is based on a single-arm thin film waveguide interferometer.

引用

页码：40 / 51

页数：12

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