Diagnostics and growth of organic thin films for electro-optic modulators with low driving voltage

被引：0
|
作者：
Liu, ZF [1 ]
Sarkisov, SS [1 ]
Curley, MJ [1 ]
Leyderman, A [1 ]
Cui, YL [1 ]
Li, JW [1 ]
Penn, B [1 ]
机构：
[1] Alabama A&M Univ, Dept Phys, Normal, AL 35762 USA
来源：
OPTICAL DEVICES AND DIAGNOSTICS IN MATERIALS SCIENCE | 2000年 / 4098卷
关键词：
single crystal organic films; electro-optic materials; electro-optic modulators;
D O I：
10.1117/12.401644
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The focus of this paper is the characterization of electro-optic properties of single crystal thin films of organic material NPP grown by the plate-guided method. Characterization was performed using the longitudinal a.c. modulation technique. Half- wave voltage V-pi, figure-of-merit F, and electra-optic coefficient r(63) were estimated to be 3.24 kV, 0.98x10(-10) m/V and 25.8x10(-12) m/V respectively. We found that crystalline z-axis is off the normal to the plane of the film at an angle of 7(0). We also proposed a transverse version of a thin film electro-optic modulator with low driving voltage, which is based on a single-arm thin film waveguide interferometer.
引用
收藏
页码：40 / 51
页数：12
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