Ionic conductivities of doped CeO2 thin films as related to their microstructure

被引：0
|
作者：
Tian, CY [1 ]
Chan, SW [1 ]
机构：
[1] COLUMBIA UNIV,HENRY KRUMB SCH MINES,DEPT CHEM ENGN MAT SCI & MIN ENGN,NEW YORK,NY 10027
来源：
ELECTRICALLY BASED MICROSTRUCTURAL CHARACTERIZATION | 1996年 / 411卷
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
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页码：277 / 282
页数：6
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