Aberrations in 4Pi Microscopy

被引：23

作者：

Hao, Xiang ^{[1
]}

Antonello, Jacopo ^{[2
]}

Allgeyer, Edward S. ^{[3
]}

Bewersdorf, Joerg ^{[1
,4
]}

Booth, Martin J. ^{[2
,5
]}

机构：

[1] Yale Sch Med, Dept Cell Biol, New Haven, CT 06520 USA

[2] Univ Oxford, Ctr Neural Circuits & Behav, Oxford OX1 3SR, England

[3] Univ Cambridge, Gurdon Inst, Cambridge CB2 1QN, England

[4] Yale Univ, Dept Biomed Engn, New Haven, CT 06510 USA

[5] Univ Oxford, Dept Engn Sci, Oxford OX1 3PJ, England

来源：

OPTICS EXPRESS | 2017年 / 25卷 / 13期

基金：

欧洲研究理事会; 英国生物技术与生命科学研究理事会; 美国国家卫生研究院; 英国惠康基金;

关键词：

NANOSCOPY; DIFFRACTION; FIELD;

D O I：

10.1364/OE.25.014049

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The combination of two opposing objective lenses in 4Pi fluorescence microscopy significantly improves the axial resolution and increases the collection efficiency. Combining 4Pi microscopy with other super-resolution techniques has resulted in the highest three-dimensional (3D) resolution in fluorescence microscopy to date. It has previously been shown that the performance of 4Pi microscopy is significantly affected by aberrations. However, a comprehensive description of 4Pi microscope aberrations has been missing. In this paper, we introduce an approach to describe aberrations in a 4Pi cavity through a new functional representation. We discuss the focusing properties of 4Pi systems affected by aberrations and discuss the implications for adaptive optics schemes for 4Pi microscopes based on this new insight. (C) 2017 Optical Society of America

引用

页码：14049 / 14058

页数：10

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