Probing structural disorder in YBCO thin films using Raman spectroscopy and x-ray diffraction

被引：0
|
作者：
Gibson, G
MacManus-Driscoll, JL
机构：
[1] Univ London Imperial Coll Sci Technol & Med, Dept Mat, London SW7 2BP, England
[2] Univ London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2BZ, England
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1998年 / 215卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
012-IEC
引用
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页码：U658 / U658
页数：1
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