Effect of a magnetic field in photodetachment microscopy

被引:66
|
作者
Chaibi, W. [1 ]
Pelaez, R. J. [1 ]
Blondel, C. [1 ]
Drag, C. [1 ]
Delsart, C. [1 ]
机构
[1] Univ Paris 11, Aime Cotton Lab, CNRS, F-91405 Orsay, France
来源
EUROPEAN PHYSICAL JOURNAL D | 2010年 / 58卷 / 01期
关键词
CLOSED CLASSICAL ORBITS; CROSS-SECTION; ELECTRON-AFFINITIES; ARBITRARY ORIENTATION; QUANTUM SPECTRA; PARALLEL; IONIZATION; INTERFERENCE; ATOMS; SI;
D O I
10.1140/epjd/e2010-00086-7
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The effect of an external static magnetic field of arbitrary orientation with respect to the electric field, on the electron interference ring patterns observed by the photodetachment microscope is studied both experimentally and theoretically. The design of the interaction chamber has been modified to superimpose a controlled uniform magnetic field on the whole volume accessible to the interfering electron. Contrary to a previous study in weaker fields, where the overall dimension of the interferogram was not modified, the effect of the magnetic field here encompasses a regime of magnetic refocusing. A quantitative analysis is carried out using a closed-orbit perturbative calculation of the interference phase at the centre of the ring pattern. The essential result of this work is still the invariance of the extreme interference phase whatever the direction and magnitude of the applied magnetic field, up to values 100 times larger than in the previous experimental study. This property can be applied to revise former electron affinity measurements. Partly due to the previously unsuspected robustness of the electron interferograms vs. magnetic fields, partly thanks to the 2006 CODATA revision of the energy conversion factors, one can update the values of the electron affinities of O-16, Si-28 and S-32 to 1.4611134(9), 1.3895210(7) and 2.0771040(6) eV respectively.
引用
收藏
页码:29 / 37
页数:9
相关论文
共 50 条
  • [41] A CRYOGENIC SYSTEM FOR FIELD EMISSION MICROSCOPY IN A MAGNETIC FIELD
    HARDIN, WR
    BLAIR, JC
    EINSPRUCH, NG
    CRYOGENICS, 1965, 5 (03) : 138 - +
  • [42] Electron affinity of tin measured by photodetachment microscopy
    Vandevraye, M.
    Drag, C.
    Blondel, C.
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2013, 46 (12)
  • [43] Interference effect in the photodetachment of silver anions by short femtosecond laser field
    Chen, Jian-hong
    Zheng, Xiao-ping
    Zhang, Tian-yun
    Dong, Xiang-cheng
    QUANTUM AND NONLINEAR OPTICS V, 2018, 10825
  • [44] Electron affinity of selenium measured by photodetachment microscopy
    Vandevraye, Mickael
    Drag, Cyril
    Blondel, Christophe
    PHYSICAL REVIEW A, 2012, 85 (01):
  • [45] Pulsed photodetachment microscopy and the electron affinity of iodine
    Pelaez, R. J.
    Blondel, C.
    Delsart, C.
    Drag, C.
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2009, 42 (12)
  • [46] Photodetachment microscopy in time-dependent fields
    Ambalampitiya, H.
    Fabrikant, I. I.
    PHYSICAL REVIEW A, 2017, 95 (05)
  • [47] Closed-orbit theory for the photodetachment rate in a static magnetic field transversely superimposed to an oscillatory electric field
    Chen, X. J.
    Titimbo, K.
    Du, M. L.
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2021, 54 (07)
  • [48] Magnetic field detection for current evaluation by magnetic force microscopy
    Takahashi, T
    Saida, D
    ULTRAMICROSCOPY, 2004, 100 (3-4) : 293 - 299
  • [49] Time-dependent electric field effect on the photodetachment dynamics of negative ions
    Wang, De-hua
    CANADIAN JOURNAL OF PHYSICS, 2017, 95 (05) : 507 - 513
  • [50] HIGH MAGNETIC FIELD GRADIENT FOR ELECTRON MICROSCOPY
    DIETRICH, I
    WEYL, R
    ZERBST, H
    CRYOGENICS, 1967, 7 (03) : 178 - &