Using the strip-yield mechanics to model fatigue crack growth by damage accumulation ahead of the crack tip

被引:16
|
作者
Ferreira, Samuel Elias [1 ]
Pinho de Castro, Jaime Tupiassu [1 ]
Meggiolaro, Marco Antonio [1 ]
机构
[1] Pontificia Univ Catolica Rio de Janeiro, Mech Engn Dept, Rio de Janeiro, Brazil
关键词
Fatigue crack growth models; Strip-yield mechanics; Crack closure; Damage accumulation ahead of the crack tip; LOAD; PROPAGATION; PREDICTION; THRESHOLD; CLOSURE;
D O I
10.1016/j.ijfatigue.2017.06.039
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Elber found in the early 70s that fatigue cracks can close under tensile loads, and assumed that fatigue crack growth (FCG) would be controlled by Delta K-eff=K-max - K-op, where K-max and K-op are the maximum and opening values of the stress intensity factor. This hypothesis can rationalize many transient effects observed under service loads, but it cannot explain many other effects like FCG retardation or arrest after overloads under high R = K-min/K-max, when K-min > K-op; FCG at constant rates under highly variable Delta K-eff; cracks arrested at a given R that can reinitiate to grow at a lower R without changing their Delta K-eff; or the R-insensitivity of FCG in inert environments. Nevertheless, strip-yield models (SYM) based on Delta K-eff ideas are more used for FCG life predictions than alternative models based on any other principles. To verify whether SYMs are indeed intrinsically better, their mechanics is used to predict FCG rates based both on Elber's ideas and on the alternative view that FCG is instead due to damage accumulation ahead of the crack tip, which does not need the Delta K-eff hypothesis or arbitrary data-fitting parameters. Despite based on conflicting principles, both models can reproduce quite well FCG data obtained under quasi constant Delta K loading, a somewhat surprising result that deserves to be carefully analyzed. (C) 2017 Elsevier Ltd. All rights reserved.
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页码:557 / 575
页数:19
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