Electron-ion coincidence spectroscopy as a new tool for surface analysis - an application to the ice surface

被引：7
|
作者：
Tanaka, S
Mase, K
Nagasono, M
Nagaoka, S
Kamada, M
Ikenaga, E
Sekitani, T
Tanaka, K
机构：
[1] Inst Mol Sci, Okazaki, Aichi 4448585, Japan
[2] Hiroshima Univ, Dept Phys Sci, Higashihiroshima 7398526, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2000年 / 39卷 / 7B期
关键词：
electron-ion coincidence spectroscopy; surface; H2O; ice; XPS; ion desorption;
D O I：
10.1143/JJAP.39.4489
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Electron-ion coincidence (EICO) spectroscopy [K. Mass, M. Nagasono, S. Tanaka, M. Kamada, T. Urisu and Y. Murata: Rev. Sci, Inst 68 (1997) 1703] has recently been developed to investigate the process of ion desorption induced by the core level excitation. In the present study, we apply EICO spectroscopy to determine the O1s level of condensed H2O (ice) at 100 K. The kinetic energy of O1s photoelectrons which gives the highest coincidence yield of H+ desorption is shifted by about -0.7 eV compared to the O1s peak observed in the conventional core-level photoelectron spectroscopy. It is ascribed to a core-level shift in the O1s level from which hydrogen ions desorb. The results indicate the advantages and the possibilities of the EICO spectroscopy for surface analysis.
引用
收藏
页码：4489 / 4492
页数：4
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