Design of Low Leakage SRAM Bit-Cell and Array

被引:0
|
作者
Ranganath, Shashank [1 ]
Bhat, Shankaranarayana M. [1 ]
Fernandes, Alden C. [1 ]
机构
[1] Manipal Univ, Elect & Commun Engn Dept, Manipal, Karnataka, India
关键词
Low Power; SRAM Cell; SRAM Array; Gate leakage; Sub-Threshold Leakage; Forward Body Biasing;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
There is an ever increasing need for running various multimedia and computer based applications on a variety of popular digital systems. These applications continue to become increasingly power-hungry and require critical performance levels. To achieve the required benchmark performance, devices have to employ high speed processors in addition to low power on-chip memory. As the power consumed during memory access accounts for a considerable portion of the total power consumption in microprocessors, there is a pressing need to reduce the power requirements of on-chip memory while making sure the data stored in the memory cells remains unchanged. This paper reports design of low leakage Static Random Access Memory (SRAM) Bit-Cell and Array. The SRAM cell and array were designed using 180nm technology and analyzed at 25 degrees C with V-DD of 1.8V using Cadence tool. The proposed SRAM cell showed an improvement of around 65% in average SPD over the 6T SRAM cell during the write '1' operation and an improvement of around 66% in average SPD over the 6T SRAM cell during the write '0' operation. Write and Read access times of the proposed 1 kB SRAM Array were recorded to be 27.92% and 25% faster than the 1 kB 6T SRAM Array respectively.
引用
收藏
页码:5 / 8
页数:4
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