Study on silicidation reaction of Fe nanodots with SiH4

被引:1
|
作者
Furuhata, Hiroshi [1 ]
Makihara, Katsunori [1 ]
Shimura, Yosuke [2 ,3 ]
Fujimori, Shuntaro [1 ]
Imai, Yuki [1 ]
Ohta, Akio [1 ]
Taoka, Noriyuki [1 ]
Miyazaki, Seiichi [1 ]
机构
[1] Nagoya Univ, Grad Sch Engn, Nagoya, Aichi 4648603, Japan
[2] Shizuoka Univ, Grad Sch Integrated Sci & Technol, Hamamatsu, Shizuoka 4328011, Japan
[3] Res Inst Elect, Hamamatsu, Shizuoka 4328011, Japan
关键词
nanodots; Fe silicide; beta-FeSi2; CVD; OPTICAL-ABSORPTION; EPITAXIAL-GROWTH; BETA-FESI2; PHOTOLUMINESCENCE; TEMPERATURE; PLASMA; ELECTROLUMINESCENCE; IMPLANTATION;
D O I
10.35848/1882-0786/ac6727
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have demonstrated the formation of Fe-silicide nanodots (NDs) on SiO2 by exposing Fe NDs to SiH4. The Fe NDs were formed by exposing ultrathin Fe film deposited on SiO2 to remote H-2-plasma. After SiH4 exposure at 400 degrees C, formation of Fe-silicide NDs with an areal dot density over 10(11) cm(-2) was confirmed. Photoluminescence from the Fe-silicide NDs was observable at room temperature in the near-infrared, being attributed to radiative recombination between quantized states in the NDs. The results will lead to the development of Si-based light-emitting devices that are highly compatible with Si ultralarge-scale-integration processing. (C) 2022 The Japan Society of Applied Physics
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页数:4
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