Non-enumerative path delay fault diagnosis

被引:0
|
作者
Padmanaban, S [1 ]
Tragoudas, S [1 ]
机构
[1] So Illinois Univ, Dept Elect & Comp Engn, Carbondale, IL 62901 USA
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The first non-enumerative framework for diagnosing path delay faults using zero suppressed binary decision diagrams is introduced. We show that fault free path delay faults with a validated non-robust test may together with fault free robustly tested faults be used to eliminate faults from the set of suspected faults. All operations are implemented by an implicit diagnosis tool based on the zero suppressed binary decision diagram. The proposed method is space and time non-enumerative as opposed to existing methods which are space and time enumerative. Experimental results on the ISCAS'85 benchmarks show that the proposed technique is on an average least three times more efficient to improve the diagnostic resolution than existing techniques.
引用
收藏
页码:322 / 327
页数:6
相关论文
共 50 条
  • [1] A non-enumerative path delay fault simulator for sequential circuits
    Parodi, CG
    Agrawal, VD
    Bushnell, ML
    Wu, SL
    [J]. INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS, 1998, : 934 - 943
  • [2] An exact non-enumerative fault simulator for path-delay faults
    Gharaybeh, MA
    Bushnell, ML
    Agrawal, VD
    [J]. INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, 1996, : 276 - 285
  • [3] Non-enumerative Generation of Path Delay Distributions and Its Application to Critical Path Selection
    Somashekar, Ahish Mysore
    Tragoudas, Spyros
    Jayabharathi, Rathish
    Gangadhar, Sreenivas
    [J]. ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2016, 22 (01)
  • [4] Non-Enumerative Correlation-Aware Path Selection
    Somashekar, Ahish Mysore
    Tragoudas, Spyros
    Jayabharathi, Rathish
    [J]. 2015 33RD IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD), 2015, : 629 - 634
  • [5] Non-Enumerative Generation of Statistical Path Delays for ATPG
    Somashekar, Ahish Mysore
    Tragoudas, Spyros
    Gangadhar, Sreenivas
    Jayabharathi, Rathish
    [J]. 2012 IEEE 30TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD), 2012, : 514 - 515
  • [6] A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits
    Stelios N. Neophytou
    Kyriakos Christou
    Maria K. Michael
    [J]. Journal of Electronic Testing, 2012, 28 : 843 - 856
  • [7] A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits
    Neophytou, Stelios N.
    Christou, Kyriakos
    Michael, Maria K.
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2012, 28 (06): : 843 - 856
  • [8] Path Delay Fault Diagnosis Using Path Scoring
    Lim, Yoseop
    Lee, Joohwan
    Kang, Sungho
    [J]. ISOCC: 2008 INTERNATIONAL SOC DESIGN CONFERENCE, VOLS 1-3, 2008, : 638 - 641
  • [9] An adaptive path delay fault diagnosis methodology
    Padmanaban, S
    Tragoudas, S
    [J]. ISQED 2004: 5TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, PROCEEDINGS, 2004, : 491 - 496
  • [10] Path delay fault diagnosis in combinational circuits with implicit fault enumeration
    Pant, P
    Hsu, YC
    Gupta, SK
    Chatterjee, A
    [J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2001, 20 (10) : 1226 - 1235