COLD SPRAY: ADVANCED CHARACTERIZATION METHODS-FOCUSED ION BEAM MACHINING AND ELECTRON PROBE MICROANALYSIS

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作者：
Srinivasan, Dheepa [1 ]
机构：
[1] GE India Technol Ctr, GE Power, Bangalore, Karnataka, India
来源：
ADVANCED MATERIALS & PROCESSES | 2017年 / 175卷 / 04期
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中图分类号：
T [工业技术];
学科分类号：
08 ;
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页码：41 / 42
页数：2
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