Measurement of refractive index and thickness of transparent plate by dual-wavelength interference

被引：71

作者：

Choi, Hee Joo ^{[1
]}

Lim, Hwan Hong ^{[1
]}

Moon, Han Seb ^{[1
]}

Eom, Tae Bong ^{[2
]}

Ju, Jung Jin ^{[3
]}

Cha, Myoungsik ^{[1
]}

机构：

[1] Pusan Natl Univ, Dept Phys, Pusan 609735, South Korea

[2] Korea Res Inst Stand & Sci, Taejon 305340, South Korea

[3] Elect & Telecommun Res Inst, Taejon 305700, South Korea

来源：

OPTICS EXPRESS | 2010年 / 18卷 / 09期

基金：

新加坡国家研究基金会;

关键词：

INTERFEROMETER; MICHELSON;

D O I：

10.1364/OE.18.009429

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We developed an accurate and efficient method for measuring the refractive indices of a transparent plate by analyzing the transmitted intensity versus angle of incidence. By using two different wavelengths, we resolved the 2 pi-ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty of 10(-5). The validity and the accuracy of our method were confirmed with a standard reference material. Furthermore, our method is insensitive to environmental perturbations, and simple to implement, compared to the conventional index measurement methods providing similar accuracy. (C) 2010 Optical Society of America

引用

页码：9429 / 9434

页数：6

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