共 50 条
- [2] Electronic structure of ZrO2 and HfO2 DEFECTS IN HIGH-K GATE DIELECTRIC STACKS: NANO-ELECTRONIC SEMICONDUCTOR DEVICES, 2006, 220 : 423 - +
- [3] Reliability concerns for HfO2/Si(and ZrO2/Si) systems:: Interface and dielectric traps 2003 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP - FINAL REPORT, 2003, : 24 - 27
- [4] Electronic structure differences in ZrO2 vs HfO2 JOURNAL OF PHYSICAL CHEMISTRY A, 2005, 109 (50): : 11521 - 11525
- [5] First-principles study of electronic and dielectric properties of ZrO2 and HfO2 CRYSTALLINE OXIDE-SILICON HETEROSTRUCTURES AND OXIDE OPTOELECTRONICS, 2003, 747 : 93 - 98
- [6] First-principles study of electronic and dielectric properties of ZrO2 and HfO2 NOVEL MATERIALS AND PROCESSES FOR ADVANCED CMOS, 2003, 745 : 283 - 288
- [7] Structural and dielectric properties of amorphous ZrO2 and HfO2 PHYSICAL REVIEW B, 2006, 74 (12):