Focused ion beam lithography applied to photonic and imprinting

被引:0
|
作者
Cabrini, Stefano [1 ,2 ]
Dhuey, Scott [1 ]
Cojoc, Dan [2 ]
Carpentiero, Alessandro [2 ]
Tormen, Massimo [2 ]
Di Fabrizio, Enzo [2 ,3 ]
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
[2] CNR, Ist Nazl Fis Mat, TASC, Basovizza Trieste, Italy
[3] Magna Graecia Univ Catanzaro, Catanzaro, Italy
关键词
focus ion beam lithography; photonic crystal; nanoimprint lithography; micro-lens;
D O I
10.1117/12.704814
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper we will discuss the use of the crossbeam ZEISS XB1540 applied to photonic structures and to obtain nano-imprinting templates. Some ID Photonic Crystals (PhC) on silica based optical waveguides are shown as well as the realization of 3D optical structures curved directly on silica and used subsequently as a master for imprinting. Focused ion beam lithography (FIB) is a technique for direct writing of patterns; it means is substantially slow, but its versatility and the combination with other "faster" techniques make it an interesting method to produce prototypes and special devices. The resolution and the perturbation of the samples are perfectly compatible with the photonic applications. In fact, the contamination due to the gallium ion implantation as well as the roughness of the vertical and horizontal surface doesn't affect the performance of the devices shown in this paper.
引用
收藏
页数:8
相关论文
共 50 条
  • [31] High energy focused ion beam lithography using P-beam writing
    Glass, GA
    Rout, B
    Dymnikov, AD
    Greco, RR
    Kamal, M
    Reinhardt, JR
    Peeples, JA
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 241 (1-4): : 397 - 401
  • [32] Comparative study of plasmonic antennas fabricated by electron beam and focused ion beam lithography
    Horak, Michal
    Bukvisova, Kristyna
    Svarc, Vojtech
    Jaskowiec, Jiri
    Krapek, Vlastimil
    Sikola, Tomas
    SCIENTIFIC REPORTS, 2018, 8
  • [33] Fabrication of photonic crystal structures by Focused Ion Beam etching
    Hill, M
    Cryan, M
    Lim, N
    Varrazza, R
    Heard, P
    Yu, S
    Rorison, J
    ICTON 2004: 6TH INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS, PROCEEDINGS, VOL 2, 2004, : 135 - 138
  • [34] Development of wide range energy focused ion beam lithography system
    Kinokuni, M
    Sawaragi, H
    Mimura, R
    Aihara, R
    Forchel, A
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (04): : 2484 - 2488
  • [35] Focused ion beam lithography using novolak-based resist
    Kojima, Yoshikatsu
    Ochiai, Yukinori
    Matsui, Shinji
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1988, 27 (09): : 1780 - 1782
  • [36] UNIQUE RESIST PROFILES WITH BE AND SI FOCUSED ION-BEAM LITHOGRAPHY
    MORIMOTO, H
    ONODA, H
    KATO, T
    SASAKI, Y
    SAITOH, K
    KATO, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01): : 205 - 208
  • [37] Comparative study of plasmonic antennas fabricated by electron beam and focused ion beam lithography
    Michal Horák
    Kristýna Bukvišová
    Vojtěch Švarc
    Jiří Jaskowiec
    Vlastimil Křápek
    Tomáš Šikola
    Scientific Reports, 8
  • [38] A FOCUSED ION-BEAM SYSTEM FOR SUB-MICRON LITHOGRAPHY
    KURIHARA, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (01): : 41 - 44
  • [39] FOCUSED ION-BEAM LITHOGRAPHY USING NOVOLAK BASED RESIST
    MATSUI, S
    KOJIMA, Y
    OCHIAI, Y
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (08) : C375 - C375
  • [40] Pinning a domain wall in (Ga,Mn)As with focused ion beam lithography
    Holleitner, AW
    Knotz, H
    Myers, RC
    Gossard, AC
    Awschalom, DD
    APPLIED PHYSICS LETTERS, 2004, 85 (23) : 5622 - 5624