Cleaning efficiency of carbon films by oxygen plasmas in the presence of metallic getters

被引:4
|
作者
Tabares, F. L. [1 ]
Ferreira, J. A. [1 ]
Tafalla, D. [1 ]
Tanarro, I. [2 ]
Herrero, V. J. [2 ]
Mendez, I. [2 ]
Gomez-Aleixandre, C. [3 ]
Albella, J. M. [3 ]
机构
[1] As Euratom Ciemat Madrid, Lab Nacl Fus, Madrid, Spain
[2] CSIC, Inst Estruct Mat, Madrid, Spain
[3] CSIC, Inst Ciencia Mat, Madrid, Spain
关键词
D O I
10.1088/1742-6596/100/6/062025
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In the present work, the effect that strong metallic getters has in the carbon removal rate by He/O-2 glow discharges is addressed. Due to the stringent conditions required for the use of Be in laboratory experiments, Li and Mg have been tested as O getters, the former showing also high H-getter properties. Samples of C/Metal mixtures are produced by introducing the metallic evaporator into the glow discharge deposition chamber, which is kept at room temperature. Two schemes were used: layered deposition and full mix-up. Hydrogen methane mixtures are used as precursors of hard a-C: H films in a DC glow discharge apparatus. The film growth and removal rate was monitored in situ through laser interferometry and particle balance from the mass spectrometer data. Surface analysis techniques have been applied for the mixed film characterization prior and after the exposure to the oxidizing plasma. Removal rates up to 12 nm/min are obtained in the absence of metals. It was found that full removal of carbon from the metal/C layers was possible for the plasma conditions used. Rates of similar value to those of pure C films were achieved except for the case of layered deposition, where a decrease in the film etching rate was observed corresponding to the location of the metal layer.
引用
收藏
页数:4
相关论文
共 50 条
  • [21] EFFICIENCY OF OXYGEN PLASMA CLEANING OF REACTIVE ION DAMAGED SILICON SURFACES
    OEHRLEIN, GS
    SCILLA, GJ
    JENG, SJ
    APPLIED PHYSICS LETTERS, 1988, 52 (11) : 907 - 909
  • [22] Catalysis of oxygen reaction on positive electrode of a lithium–oxygen cell in the presence of metallic nanosystems
    O. V. Korchagin
    M. R. Tarasevich
    O. V. Tripachev
    V. A. Bogdanovskaya
    Protection of Metals and Physical Chemistry of Surfaces, 2016, 52 : 581 - 589
  • [23] OXYGEN TRANSFER BETWEEN CARBON DIOXIDE AND CARBON MONOXIDE IN THE PRESENCE OF CARBON
    ORNING, AA
    STERLING, E
    JOURNAL OF PHYSICAL CHEMISTRY, 1954, 58 (11): : 1044 - 1047
  • [24] Quantum fluctuations in the presence of thin metallic films and anisotropic materials
    Iannuzzi, Davide
    Lisanti, Mariangela
    Munday, Jeremy N.
    Capasso, Federico
    JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 2006, 39 (21): : 6445 - 6454
  • [25] Static friction modeling in the presence of soft thin metallic films
    Liu, ZQ
    Neville, A
    Reuben, RL
    JOURNAL OF TRIBOLOGY-TRANSACTIONS OF THE ASME, 2002, 124 (01): : 27 - 35
  • [26] The Removal of Thin Oxygen and Carbon Surface Films by H2/Ar Plasmas as Characterized by Low kV EDS
    Tracy, B.
    Sharma, U.
    Casenave, J.
    Nylese, T.
    Rafaelsen, J.
    Carlino, V.
    Fahey, M.
    ISTFA 2016: CONFERENCE PROCEEDINGS FROM THE 42ND INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2016, : 490 - 492
  • [27] CARBON MONOXIDE FORMATION IN UO2 KERNELED HTR FUEL PARTICLES CONTAINING OXYGEN GETTERS.
    Proksch, E.
    Strigl, A.
    Nabielek, H.
    1600, (139):
  • [28] THE PHOTOLYSIS OF CYCLOHEXANONE IN PRESENCE OF OXYGEN AND OF CARBON DIOXIDE
    DUNN, JR
    KUTSCHKE, KO
    CANADIAN JOURNAL OF CHEMISTRY-REVUE CANADIENNE DE CHIMIE, 1954, 32 (07): : 725 - 727
  • [29] RADIOLYSIS OF CARBON TETRACHLORIDE IN PRESENCE OF AIR AND OXYGEN
    SPURNY, Z
    INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1963, 14 (07): : 337 - &
  • [30] Development of carbon deposits cleaning technique for metallic mirrors in HL-2A
    Zhou, Y.
    Zheng, L.
    Li, Y. G.
    Li, L. C.
    Li, C. Z.
    Jiao, Y. M.
    Deng, Z. C.
    Zhao, G.
    Gao, H.
    Yang, Q. W.
    Duan, X. R.
    JOURNAL OF NUCLEAR MATERIALS, 2011, 415 (01) : S1206 - S1209