Back illuminated AlGaN solar-blind photodetectors

被引:88
|
作者
Lambert, DJH [1 ]
Wong, MM [1 ]
Chowdhury, U [1 ]
Collins, C [1 ]
Li, T [1 ]
Kwon, HK [1 ]
Shelton, BS [1 ]
Zhu, TG [1 ]
Campbell, JC [1 ]
Dupuis, RD [1 ]
机构
[1] Univ Texas, Microelect Res Ctr, Austin, TX 78712 USA
关键词
D O I
10.1063/1.1311821
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the growth, fabrication, and characterization of AlxGa1-xN (0 less than or equal to x less than or equal to 0.60) heteroepitaxial back-illuminated solar-blind p-i-n photodiodes on (0001) sapphire substrates. The group III-nitride heteroepitaxial layers are grown by low-pressure metalorganic chemical vapor deposition on double polished sapphire substrates using various growth conditions. The back-illuminated devices exhibit very low dark current densities. Furthermore, they exhibit external quantum efficiencies up to 35% at the peak of the photoresponse (lambda similar to 280 nm). Improvements were made to the growth technique in order to achieve crack-free Al0.4Ga0.6N active regions on a thick Al0.6Ga0.4N window layer and to obtain activated p-type Al0.4Ga0.6N layers. (C) 2000 American Institute of Physics. [S0003-6951(00)05438-3].
引用
收藏
页码:1900 / 1902
页数:3
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