Reliability of a connected-(r(1), s(1))-or-(r(2), s(2))-or-..-or-(r(k), s(k))-out-of(m,n):F lattice system

被引:8
|
作者
Yamamoto, H
机构
[1] Department of Management Engineering, Nishi-Tokyo University, Uenohara
来源
MICROELECTRONICS AND RELIABILITY | 1996年 / 36卷 / 02期
关键词
D O I
10.1016/0026-2714(95)00106-C
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A (linear or circular) connected-(r(1), s(1))-or-(r(2), s(2))-or-..-or-(r(k), s(k))-out-of-(m, n):F lattice system is the (linear or circular) (m, n)-lattice system if the system fails whenever all components in a connected-(r(1), s(1))-submatrix or all components in a connected-(r(2), s(2))-submatrix or or all components in a connected-(r(k), s(k))-submatrix fail. This paper presents a recursive algorithm for the reliability of the (linear or circular) connected-(r(1), s(1))-or-(r(2), s(2))-or-..-or-(r(k), s(k))-out-of-(m, n):F lattice system. The recursive algorithm requires GRAPHICS time and GRAPHICS time in the Linear case and the circular case, respectively. Furthermore, we on reduce the more computing time in the statistically independent and identically distributed case or considering some special systems. Especially, the closed formula is given for the reliability of the linear connected-(2, 1)-or-(1, 2)-out-of-(m, 2):F lattice system in the statistically independent and identically distributed case.
引用
收藏
页码:151 / 168
页数:18
相关论文
共 50 条