Evanescent wave spectroscopy for in-situ cure monitoring

被引:3
|
作者
Cossins, SL
Connell, ME
Cross, WM
Winter, RM
Kellar, JJ
机构
关键词
epoxy cure monitoring; silica optical fibers; near-IR; evanescent wave spectroscopy;
D O I
10.1117/12.260588
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The curing of epoxy adjacent an embedded silica fiber has been monitored in situ by evanescent wave spectroscopy. The epoxy studied is partially fluorinated and has a lower refractive index than the silica optical fiber. This lower refractive index allows the silica optical fiber to be used as a waveguide for the internal reflection of near-infrared light. The curing agent was polyoxypropylenediamine. The epoxy curing was monitored as a function of time by analysis of the near-infrared spectra of the epoxy/curing agent adjacent the fiber. The results obtained from the examination of the near-infrared spectra, particularly the disappearance of the primary N-H stretching/bending combination band at similar to 4935 cm(-1) and the accompanying increase of the C-N overtone band at similar to 4650 cm(-1), showed that the epoxy curing reaction could be followed in real time using an 85 micron diameter silica optical fiber bundle. It was found that the primary amine groups are essentially completely reacted after 60 minutes.
引用
收藏
页码:147 / 156
页数:10
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