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- [33] Atomic force microscopy study of electron beam written contamination structures Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena, 1996, 14 (01):
- [36] Atomic force microscopy study of electron beam written contamination structures JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (01): : 54 - 62
- [37] Probing nanometer structures with atomic force microscopy NEWS IN PHYSIOLOGICAL SCIENCES, 1999, 14 : 142 - 149