Tolerating multiple faults in multistage interconnection networks with minimal extra stages

被引:36
|
作者
Fan, CC [1 ]
Bruck, J [1 ]
机构
[1] CALTECH, Dept Elect Engn, Pasadena, CA 91125 USA
基金
美国国家航空航天局; 美国国家科学基金会;
关键词
Multistage Interconnection Networks (MIN); fault tolerance; extrastage; switch faults; stage masks;
D O I
10.1109/12.869334
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In their 1982 paper. Adams and Siegel proposed an Extra Stage Cube Interconnection Network that tolerates one switch failure with one extra stage. We extend their results and discover a class of Extra Stage Interconnection Networks that tolerate multiple switch failures with a minimal number of extra stages. Adopting the same fault model as Adams and Siegel, the faulty switches can be bypassed by a pair of demultiplexer/multiplexer combinations. It is easy to show that, to maintain point to point and broadcast connectivities. there must be at least of extra stages to tolerate f switch failures. We present the first known construction of an Extra Stage Interconnection Network that meets this lower-bound. This n-dimensional Multistage Interconnection Network has n + f stages and tolerates f switch failures. An n-bit label called mask is used for each stage that indicates the bit differences between the two inputs coming into a common switch. We designed the fault-tolerant construction such that it repeatedly uses the singleton basis of the n-dimensional vector space as the stage mask vectors. This construction is further generalized and we prove that an n-dimensional Muitistage Interconnection Network is optimally fault-tolerant if and only if the mask vectors of every n consecutive stages span the n-dimensional vector space.
引用
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页码:998 / 1004
页数:7
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