High-Transmission-Efficiency 120° Photonic Crystal Waveguide Bend by Using Flexible Structural Defects
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作者:
Tee, D. C.
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Univ Malaya, Fac Engn, Dept Elect Engn, Integrated Lightwave Res Grp, Kuala Lumpur 50603, MalaysiaUniv Malaya, Fac Engn, Dept Elect Engn, Integrated Lightwave Res Grp, Kuala Lumpur 50603, Malaysia
Tee, D. C.
[1
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Tamchek, N.
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Univ Putra Malaysia, Fac Sci, Dept Phys, Serdang 43400, MalaysiaUniv Malaya, Fac Engn, Dept Elect Engn, Integrated Lightwave Res Grp, Kuala Lumpur 50603, Malaysia
Tamchek, N.
[2
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Abu Bakar, M. H.
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Univ Putra Malaysia, Fac Engn, Wireless & Photon Networks Res Ctr, Serdang 43400, MalaysiaUniv Malaya, Fac Engn, Dept Elect Engn, Integrated Lightwave Res Grp, Kuala Lumpur 50603, Malaysia
Abu Bakar, M. H.
[3
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Adikan, F. R. Mahamd
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Univ Malaya, Fac Engn, Dept Elect Engn, Integrated Lightwave Res Grp, Kuala Lumpur 50603, MalaysiaUniv Malaya, Fac Engn, Dept Elect Engn, Integrated Lightwave Res Grp, Kuala Lumpur 50603, Malaysia
Adikan, F. R. Mahamd
[1
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机构:
[1] Univ Malaya, Fac Engn, Dept Elect Engn, Integrated Lightwave Res Grp, Kuala Lumpur 50603, Malaysia
[2] Univ Putra Malaysia, Fac Sci, Dept Phys, Serdang 43400, Malaysia
[3] Univ Putra Malaysia, Fac Engn, Wireless & Photon Networks Res Ctr, Serdang 43400, Malaysia
We numerically studied a high-output-transmission-efficiency low-reflection-loss 120 degrees photonic crystal (PhC) waveguide bend based on a PhC slab with triangular-lattice air holes. The desired high output transmission efficiency was achieved by introducing flexible structural defects into the bend region of the waveguide. Simulation results obtained using a 3-D finite-difference time-domain method indicated that normalized output transmission as high as 94.3% and negligible normalized reflection loss of 0.1% were obtained at the 1550-nm optical wavelength. Furthermore, the normalized output transmission was more than 90% within the entire optical C-band. In addition, sensitivity of the design parameters of the structural defect was studied to understand the tolerance in the fabrication error, while maintaining high output transmission efficiency.
机构:
The 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
National Opto-Electronic Primary Metrology Laboratory, Qingdao, China
School of Information Science and Engineering, Shandong University, Qingdao, ChinaThe 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
Li, Haoyu
Li, Baoshuai
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The 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
National Opto-Electronic Primary Metrology Laboratory, Qingdao, ChinaThe 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
Li, Baoshuai
Zhuang, Xingang
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The 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
National Opto-Electronic Primary Metrology Laboratory, Qingdao, ChinaThe 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
Zhuang, Xingang
Chen, Lingyun
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College of Optics and Electronic Science and Technology, China Jiliang University, Hangzhou, ChinaThe 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
Chen, Lingyun
Wu, Bin
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机构:
The 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
National Opto-Electronic Primary Metrology Laboratory, Qingdao, ChinaThe 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
Wu, Bin
Zhao, Luo
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The 41st Institute of China Electronics Technology Group Corporation, Qingdao, ChinaThe 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
Zhao, Luo
Zhu, Xingbang
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The 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
National Opto-Electronic Primary Metrology Laboratory, Qingdao, ChinaThe 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
Zhu, Xingbang
Gao, Yesheng
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The 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
National Opto-Electronic Primary Metrology Laboratory, Qingdao, ChinaThe 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
Gao, Yesheng
Wu, Hengkui
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The 41st Institute of China Electronics Technology Group Corporation, Qingdao, ChinaThe 41st Institute of China Electronics Technology Group Corporation, Qingdao, China
机构:
Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
Guangdong Univ Petrochem Technol, Dept Phys, Maoming 525000, Peoples R ChinaChinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
Zhang Chang-xin
Xu Xing-sheng
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Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R ChinaChinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China