Scanning force microscope and vacuum chamber for the study of ice films: Design and first results

被引:26
|
作者
Bluhm, H [1 ]
Pan, SH [1 ]
Xu, L [1 ]
Inoue, T [1 ]
Ogletree, DF [1 ]
Salmeron, M [1 ]
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1998年 / 69卷 / 04期
关键词
D O I
10.1063/1.1148841
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present the design of a scanning force microscope and vacuum chamber for the growth and imaging of ice films in thermodynamic equilibrium and under controlled super or undersaturation. The apparatus allows measurements in the temperature range from -60 to +80 degrees C in a controlled water vapor atmosphere. First results on the morphology and the frictional properties of thin ice films on mica cleavage faces are presented. The films are found to grow in a two-dimensional manner, often exhibiting dendritic growth shapes. The lateral force measured on ice is higher than that observed on the surrounding substrate. (C) 1998 American Institute of Physics. [S0034-6748(98)05804-3].
引用
收藏
页码:1781 / 1784
页数:4
相关论文
共 50 条
  • [31] Study of the surface of ice, ice/solid and ice/liquid interfaces with scanning force microscopy
    Petrenko, VF
    JOURNAL OF PHYSICAL CHEMISTRY B, 1997, 101 (32): : 6276 - 6281
  • [32] SCANNING CAPACITACE MICROSCOPE ATOMIC-FORCE MICROSCOPE SCANNING TUNNELING MICROSCOPE STUDY OF ION-IMPLANTED SILICON SURFACES
    TOMIYE, H
    KAWAMI, H
    IZAWA, M
    YOSHIMURA, M
    YAO, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (6B): : 3376 - 3379
  • [33] APPLICATION OF SCANNING ELECTRON MICROSCOPE TO STUDY OF RUST FILMS
    GALLAGHE.WP
    CORROSION, 1969, 25 (12) : 15 - &
  • [34] APPLICATION OF SCANNING ELECTRON MICROSCOPE TO STUDY OF RUST FILMS
    GALLAGHE.WP
    MATERIALS PROTECTION, 1969, 8 (12): : 58 - &
  • [35] Scanning force microscope studies of Langmuir-Blodgett polyaniline thin films
    Porter, TL
    Thompson, D
    Bradley, M
    THIN SOLID FILMS, 1996, 288 (1-2) : 268 - 271
  • [36] Temperature dependent nano indentation of thin polymer films with the scanning force microscope
    Hinz, M
    Kleiner, A
    Hild, S
    Marti, O
    Dürig, U
    Gotsmann, B
    Drechsler, U
    Albrecht, TR
    Vettiger, P
    EUROPEAN POLYMER JOURNAL, 2004, 40 (05) : 957 - 964
  • [37] Nanolithography of metal films using scanning force microscope patterned carbon masks
    Mühl, T
    Brückl, H
    Kraut, D
    Kretz, J
    Mönch, I
    Reiss, G
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (06): : 3879 - 3882
  • [38] Dissolution of the periclase (001) surface: A scanning force microscope study
    Jordan, G
    Higgins, SR
    Eggleston, CM
    AMERICAN MINERALOGIST, 1999, 84 (1-2) : 144 - 151
  • [39] Study of nano-tribology using scanning force microscope
    Sumomogi, T
    Endo, T
    Matsuo, S
    PROCEEDINGS OF THE FOURTEENTH ANNUAL MEETING OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1999, : 424 - 427
  • [40] Scanning force microscope study of detachment of nanometer adhering particulates
    Dickinson, JT
    Hariadi, RF
    Scudiero, L
    Langford, SC
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2000, 288 (02): : 182 - 186