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Airy Plasmon Pulses investigated by Multiphoton Photoemission Electron Microscopy (PEEM)

被引：0
|
作者：
Singh, Amit Vikram [1 ,2 ]
Falkner, Matthias [1 ,2 ]
Kaiser, Thomas [1 ,2 ]
Zilk, Matthias [1 ,2 ]
Steinert, Michael [1 ,2 ]
Pertsch, Thomas [1 ,2 ]
机构：
[1] Friedrich Schiller Univ Jena, Inst Appl Phys, Max Wien Pl 1, D-07743 Jena, Germany
[2] Friedrich Schiller Univ Jena, Abbe Ctr Photon, Max Wien Pl 1, D-07743 Jena, Germany
来源：
2019 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC) | 2019年
关键词：
D O I：
10.1109/cleoe-eqec.2019.8873278
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页数：1
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