Influence of band structure on the apparent barrier height in scanning tunneling microscopy

被引:25
|
作者
Becker, Michael [1 ]
Berndt, Richard [1 ]
机构
[1] Univ Kiel, Inst Expt & Angew Physik, D-24098 Kiel, Germany
关键词
THIN INSULATING FILM; LOCAL WORK FUNCTION; METAL-SURFACES; ELECTRONIC-STRUCTURE; STATES; AU(111); STM; SPECTROSCOPY; DENSITY; AG(111);
D O I
10.1103/PhysRevB.81.035426
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The apparent height of the tunneling barrier in scanning tunneling microscopy measured on Au(111), Ag(111), and Cu(111) surfaces is found to vary significantly with the bias voltage. In particular, the apparent barrier height phi(a) is asymmetric with respect to the bias polarity on all three surfaces, in contrast to simple interpretations of phi(a) in terms of an average work function of tip and sample. Model calculations of the tunneling current, which take band-structure effects into account, describe the experimental observations.
引用
收藏
页数:6
相关论文
共 50 条
  • [1] BAND BENDING AND THE APPARENT BARRIER HEIGHT IN SCANNING TUNNELING MICROSCOPY
    WEIMER, M
    KRAMAR, J
    BALDESCHWIELER, JD
    [J]. PHYSICAL REVIEW B, 1989, 39 (08) : 5572 - 5575
  • [2] APPARENT BARRIER HEIGHT IN SCANNING TUNNELING MICROSCOPY
    LANG, ND
    [J]. PHYSICAL REVIEW B, 1988, 37 (17): : 10395 - 10398
  • [3] Apparent barrier height in scanning tunneling microscopy revisited
    Olesen, L
    Brandbyge, M
    Sorensen, MR
    Jacobsen, KW
    Laegsgaard, E
    Stensgaard, I
    Besenbacher, F
    [J]. PHYSICAL REVIEW LETTERS, 1996, 76 (09) : 1485 - 1488
  • [4] Contrast inversion of the apparent barrier height of Pb thin films in scanning tunneling microscopy
    Becker, Michael
    Berndt, Richard
    [J]. APPLIED PHYSICS LETTERS, 2010, 96 (03)
  • [5] Study on tunneling current through barrier height using scanning tunneling microscopy
    Lee, Nam-Suk
    Qian, Dong-Jin
    Shin, Hoon-Kyu
    Kwon, Young-Soo
    [J]. IEEE NMDC 2006: IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE 2006, PROCEEDINGS, 2006, : 570 - +
  • [6] APPARENT BARRIER HEIGHT FOR TUNNELING ELECTRONS IN STM
    PITARKE, JM
    ECHENIQUE, PM
    FLORES, F
    [J]. SURFACE SCIENCE, 1989, 217 (1-2) : 267 - 275
  • [7] Influence of barrier height on scanning tunneling spectroscopy experimental and theoretical aspects
    Stievenard, D
    Grandidier, B
    Nys, JP
    de la Broise, X
    Delerue, C
    Lannoo, M
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (05) : 569 - 571
  • [8] APPARENT SUPERSTRUCTURES IN SCANNING-TUNNELING-MICROSCOPY
    LI, JT
    BERNDT, R
    SCHNEIDER, WD
    [J]. APPLIED PHYSICS LETTERS, 1995, 67 (07) : 921 - 923
  • [9] On the effect of local barrier height in scanning tunneling microscopy: Measurement methods and control implications
    Tajaddodianfar, Farid
    Moheimani, S. O. Reza
    Owen, James
    Randall, John N.
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2018, 89 (01):
  • [10] Scanning tunneling microscopy and barrier-height imaging of subsurface dopants on GaAs(110)
    Kobayashi, K
    Kurokawa, S
    Sakai, A
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (12): : 8619 - 8624