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- [22] Development of spatial nearest-neighbor analysis and Clustering/Gibbs statistical methodology for filament percolation in dielectric breakdown and forming process in ReRAM devices 2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2021,
- [26] Fault Detection and Isolation of Non-Gaussian and Nonlinear Processes Based on Statistics Pattern Analysis and the k-Nearest Neighbor Method ACS OMEGA, 2022, 7 (22): : 18623 - 18637