Energy level alignment at metal/organic semiconductor interfaces:: "Pillow" effect, induced density of interface states, and charge neutrality level

被引:174
|
作者
Vazquez, H. [1 ]
Dappe, Y. J. [1 ]
Ortega, J. [1 ]
Flores, F. [1 ]
机构
[1] Univ Autonoma Madrid, Dept Fis Teor Mat Condensada, E-28049 Madrid, Spain
来源
JOURNAL OF CHEMICAL PHYSICS | 2007年 / 126卷 / 14期
关键词
D O I
10.1063/1.2717165
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A unified model, embodying the "pillow" effect and the induced density of interface states (IDIS) model, is presented for describing the level alignment at a metal/organic interface. The pillow effect, which originates from the orthogonalization of the metal and organic wave functions, is calculated using a many-body linear combination of atomic orbitals Hamiltonian, whereby electron long-range interactions are obtained using an expansion in the metal/organic wave function overlap, while the electronic charge of both materials remains unchanged. This approach yields the pillow dipole and represents the first effect induced by the metal/organic interaction, resulting in a reduction of the metal work function. In a second step, we consider how charge is transferred between the metal and the organic material by means of the IDIS model: Charge transfer is determined by the relative position of the metal work function (corrected by the pillow effect) and the organic charge neutrality level, as well as by an interface parameter S, which measures how this potential difference is screened. In our approach, we show that the combined IDIS-pillow effects can be described in terms of the original IDIS alignment corrected by a screened pillow dipole. For the organic materials considered in this paper, we see that the IDIS dipole already represents most of the realignment induced at the metal/organic interface. We therefore conclude that the pillow effect yields minor corrections to the IDIS model. (c) 2007 American Institute of Physics.
引用
收藏
页数:8
相关论文
共 50 条
  • [21] Energy level alignment and interfacial electronic structures at organic metal and organic organic interfaces
    Ishii, H
    Sugiyama, K
    Ito, E
    Seki, K
    ADVANCED MATERIALS, 1999, 11 (08) : 605 - +
  • [23] Energy level alignment at organic/metal interfaces studied by UV photoemission: Breakdown of traditional assumption of a common vacuum level at the interface
    Ishii, H
    Seki, K
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (08) : 1295 - 1301
  • [24] Energy level alignment at Alq/metal interfaces
    Lee, ST
    Hou, XY
    Mason, MG
    Tang, CW
    APPLIED PHYSICS LETTERS, 1998, 72 (13) : 1593 - 1595
  • [25] The role of the density of interface states in interfacial energy level alignment of PTCDA
    Khoshkhoo, Mahdi Samadi
    Peisert, Heiko
    Chasse, Thomas
    Scheele, Marcus
    ORGANIC ELECTRONICS, 2017, 49 : 249 - 254
  • [26] Dipoles at molecule-semiconductor interfaces: energy level alignment and charge transfer properties
    Galoppini, Elena
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2016, 252
  • [27] The role of gap states in the energy level alignment at the organic-organic heterojunction interfaces
    Zhong, Shu
    Zhong, Jian Qiang
    Mao, Hong Ying
    Zhang, Jia Lin
    Lin, Jia Dan
    Chen, Wei
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2012, 14 (41) : 14127 - 14141
  • [28] Effect of ground state charge transfer and photoinduced charge separation on the energy level alignment at metal halide perovskite/organic charge transport layer interfaces
    Lennart Frohloff
    Fengshuo Zu
    Dongguen Shin
    Norbert Koch
    Applied Physics A, 2023, 129
  • [29] Effect of ground state charge transfer and photoinduced charge separation on the energy level alignment at metal halide perovskite/organic charge transport layer interfaces
    Frohloff, Lennart
    Zu, Fengshuo
    Shin, Dongguen
    Koch, Norbert
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2023, 129 (04):
  • [30] Energy band and vacuum level alignment at a semiconductor-molecule-metal interface
    Cleri, Fabrizio
    APPLIED PHYSICS LETTERS, 2008, 92 (10)