Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy

被引:46
|
作者
Riedel, C. [1 ,2 ,3 ]
Sweeney, R. [4 ]
Israeloff, N. E. [4 ]
Arinero, R. [1 ]
Schwartz, G. A. [5 ]
Alegria, A. [2 ,3 ]
Tordjeman, Ph. [6 ]
Colmenero, J. [2 ,3 ,5 ]
机构
[1] Univ Montpellier 2, IES, CNRS, UMR 5214, F-34095 Montpellier, France
[2] Univ Basque Country, Dept Fis Mat, Fac Quim, San Sebastian 20080, Spain
[3] Donostia Int Phys Ctr, San Sebastian 20018, Spain
[4] Northeastern Univ, Dept Phys, Boston, MA 02115 USA
[5] CSIC Univ Basque Country, Ctr Fis Mat, San Sebastian 20018, Spain
[6] Univ Toulouse, CNRS, IMFT, F-31400 Toulouse, France
基金
美国国家科学基金会;
关键词
DEPENDENCE; PRESSURE; FILMS;
D O I
10.1063/1.3431288
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have developed a method for imaging the temperature-frequency dependence of the dynamics of nanostructured polymer films with spatial resolution. This method provides images with dielectric compositional contrast well decoupled from topography. Using frequency-modulation electrostatic-force-microscopy, we probe the local frequency-dependent (0.1-100 Hz) dielectric response through measurement of the amplitude and phase of the force gradient in response to an oscillating applied electric field. When the phase is imaged at fixed frequency, it reveals the spatial variation in dielectric losses, i.e., the spatial variation in molecular/dipolar dynamics, with 40 nm lateral resolution. This is demonstrated by using as a model system; a phase separated polystyrene/polyvinyl-acetate (PVAc) blend. We show that nanoscale dynamic domains of PVAc are clearly identifiable in phase images as those which light-up in a band of temperature, reflecting the variations in the molecular/dipolar dynamics approaching the glass transition temperature of PVAc. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3431288]
引用
收藏
页数:3
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