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Ionization mechanisms in dielectrics irradiated by femtosecond laser pulses

被引：8
|
作者：
Temnov, VV [1 ]
Sokolowski-Tinten, K [1 ]
Zhou, P [1 ]
Rethfeld, B [1 ]
Gruzdev, VE [1 ]
El-Khamawy, A [1 ]
von der Linde, D [1 ]
机构：
[1] Univ Duisburg Essen, Inst Expt Phys, D-45117 Essen, Germany
来源：
HIGH-POWER LASER ABLATION V, PTS 1 AND 2 | 2004年 / 5448卷
关键词：
fs-laser-induced ionization of dielectrics; time-resolved interferometry;
D O I：
10.1117/12.547145
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
In order to investigate the ultrafast dynamics of free carriers generated in bulk dielectrics by intense femtosecond laser pulses we have designed a setup for ultrafast time-resolved imaging Mach-Zehnder interferometry. The application of the 2D-Fourier-transform technique allows us to accurately reconstruct the actual laser-induced phase shifts and transmission changes for the probe pulses, which provide the properties of free carriers. Interferometric measurements in high-purity fused silica clearly demonstrate that the dominant ionization mechanism for intensities below 10 TW/cm(2) is multiphoton ionization.
引用
收藏
页码：1119 / 1126
页数：8
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