Simulation of random jitter in ring oscillators with SPICE

被引：0
|
作者：
Chen, YQ [1 ]
Koneru, S [1 ]
Lee, E [1 ]
Geiger, R [1 ]
机构：
[1] Iowa State Univ Sci & Technol, Dept Elect & Comp Engn, Ames, IA 50011 USA
来源：
40TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1 AND 2 | 1998年
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
A time domain model of the semiconductor device noise sources that includes operating region dependencies and is suitable for incorporation into the SPICE simulator is presented. Simulation results of the random jitter for practical MOS ring oscillators are discussed.
引用
收藏
页码：1154 / 1157
页数：2
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