Analysis of SOI micro ring resonator with reflection property using low coherence interferometry method

被引:0
|
作者
Chen, Chun Yen [1 ]
Wang, Cheng Yu [1 ]
Chen, Yung Jui [1 ]
机构
[1] Natl Sun Yat Sen Univ, Dept Photon, Kaohsiung 80424, Taiwan
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Low coherence interferometry (LCI) is an effective method for analyzing optical ring resonator properties. We present experimental and analytical LCI results of SOI micro-ring resonator that demonstrate new reflection effect at the ring coupling region.
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页码:260 / 262
页数:3
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