Detection of physical defects in solar cells by hyperspectral imaging technology

被引：30
|
作者：
Li, Qingli [1 ]
Wang, Weisheng [1 ]
Ma, Chao [1 ]
Zhu, Ziqiang [1 ]
机构：
[1] E China Normal Univ, Key Lab Polar Mat & Devices, Sch Informat Sci & Technol, Shanghai 200062, Peoples R China
来源：
OPTICS AND LASER TECHNOLOGY | 2010年 / 42卷 / 06期
基金：
中国国家自然科学基金;
关键词：
Solar cell; Material defect detection; Hyperspectral imaging; SILICON-WAFERS; IMPACT;
D O I：
10.1016/j.optlastec.2010.01.022
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A hyperspectral imaging system is developed and is used to identify cracks and fracture defects in solar cells. The basic principles and key technologies of this system are presented, along with a characterization of its performance. The system can provided both single-band images and spectrums of solar cells by laser scanning and hyperspectral imaging. The spectral angle mapper algorithm is used to identify cracks on the surface of solar cells. Experiment results show that this is a non-contact, no-destructive method for detecting cracks in solar cells. Crown Copyright (C) 2010 Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：1010 / 1013
页数：4
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