Low Voltage GaN-Based Gate Driver to Increase Switching Speed of Paralleled 650 V E-mode GaN HEMTs

被引:2
|
作者
Risch, Raffael [1 ]
Biela, Juergen [1 ]
机构
[1] Swiss Fed Inst Technol, Lab High Power Elect Syst, Zurich, Switzerland
关键词
Gallium Nitride (GaN); Parallel operation; Pulsed power; Design; Wide bandgap devices;
D O I
10.23919/epe20ecceeurope43536.2020.9215773
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Using GaN HEMTs in high current applications, such as pulsed power modulators for particle accelerator systems, requires the parallelization of multiple devices, In order to achieve a dynamically balanced current distribution between the parallel devices, synchronized gate voltages are crucial. Furthermore, the high switching speeds, which are often required in pulsed power systems, requires a high driving current capability and fast rise/fall times of the gate driver. Therefore, this paper presents a gate driver, based on a low voltage GaN HEMT half bridge, for driving four paralleled 650V e-mode GaN HEMTs in a low inductive switching cell design.
引用
收藏
页数:11
相关论文
共 50 条
  • [1] Progress of GaN-based E-mode HEMTs
    Huang, Huolin
    Lei, Yun
    Sun, Nan
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2024, 57 (41)
  • [2] Design Consideration of Gate Driver Circuits and PCB Parasitic Parameters of Paralleled E-mode GaN HEMTs in Zero-Voltage-Switching Applications
    Lu, Juncheng
    Bai, Hua
    Brown, Alan
    McAmmond, Matt
    Chen, Di
    Styles, Julian
    APEC 2016 31ST ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, 2016, : 529 - 535
  • [3] Design of a Gate Driver Based-on E-mode p-GaN HEMTs Handling 650V/10A GaN Power Device
    Pozo, Nataly
    Procel, Luis-Miguel
    Trojman, Lionel
    2024 22ND IEEE INTERREGIONAL NEWCAS CONFERENCE, NEWCAS 2024, 2024, : 333 - 337
  • [4] Investigations on Driver and Layout for Paralleled GaN HEMTs in Low Voltage Application
    Zhang, Yajing
    Li, Jianguo
    Wang, Jiuhe
    IEEE ACCESS, 2019, 7 : 179134 - 179142
  • [5] An Integrated Gate Driver for E-mode GaN HEMTs with Active Clamping for Reverse Conduction Detection
    Zhang, Wei Jia
    Leng, Yahui
    Yu, Jingshu
    Lu, Yu Shen
    Cheng, Chu Yao
    Ng, Wai Tung
    2019 31ST INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD), 2019, : 83 - 86
  • [6] A Segmented Gate Driver for E-mode GaN HEMTs with Simple Driving Strength Pattern Control
    Zhang, Wei Jia
    Yu, Jingshu
    Leng, Yahui
    Cui, Wen Tao
    Deng, Gao Qiang
    Ng, Wai Tung
    PROCEEDINGS OF THE 2020 32ND INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD 2020), 2020, : 102 - 105
  • [7] I-V Characteristics of E-mode GaN-based transistors under gate floating
    Qin, Zhen-Wei
    Tsai, Wen-Hsuan
    Chen, Wei-Chia
    Lo, Hao-Hsuan
    Hsin, Yue-Ming
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2022, 37 (04)
  • [8] A Comprehensive Model for Gate Current in E-Mode p-GaN HEMTs
    Bhat, Zarak
    Ahsan, Sheikh Aamir
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (03) : 1812 - 1819
  • [9] Device Characteristics of E-mode GaN HEMTs with a Second Gate Connected to the Source
    Chih-Wei Chen
    Wei-Chen Ho
    Yue-Ming Hsin
    Jerry Tzou
    Wen-Hsien Huang
    Chang-Hong Shen
    Jia-Ming Shieh
    Wen-Kuan Yeh
    Wen-Ta Hsu
    Sze-Ching Liu
    Journal of Electronic Materials, 2020, 49 : 6776 - 6782
  • [10] Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis
    Rossetto, Isabella
    Meneghini, Matteo
    Rizzato, Vanessa
    Ruzzarin, Maria
    Favaron, Andrea
    Stoffels, Steve
    Van Hove, Marleen
    Posthuma, Niels
    Wu, Tian-Li
    Marcon, Denis
    Decoutere, Stefaan
    Meneghesso, Gaudenzio
    Zanoni, Enrico
    MICROELECTRONICS RELIABILITY, 2016, 64 : 547 - 551