Reliability of power electronic devices against cosmic radiation-induced failure

被引：26
|
作者：
Soelkner, G
Kaindl, W
Schulze, HJ
Wachutka, G
机构：
[1] Infineon Technol Automot & Ind, D-81730 Munich, Germany
[2] Tech Univ Munich, Inst Phys Electrotechnol, D-80290 Munich, Germany
来源：
MICROELECTRONICS RELIABILITY | 2004年 / 44卷 / 9-11期
关键词：
D O I：
10.1016/j.microrel.2004.07.024
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Cosmic radiation has been identified as a decisive factor for power device reliability. Energetic neutrons create ionizing recoils within the semiconductor substrate which may lead to device burnout. Originally, this failure mechanism was attributed to high voltage devices only. However, the results of accelerated nucleon radiation tests made it clear that cosmic radiation-induced breakdown can no longer be disregarded for the design of power devices of voltages classes as low as 500V. Extensive device simulations supported by ion irradiation experiments gave quantitative results and may in the future allow for a predictive assessment of the cosmic radiation hardness of a specific device design. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码：1399 / 1406
页数：8
相关论文
共 50 条
  • [21] Accurate analytical modelling of cosmic ray induced failure rates of power semiconductor devices
    Bauer, Friedhelm D.
    SOLID-STATE ELECTRONICS, 2009, 53 (06) : 584 - 589
  • [22] RADIATION-INDUCED SURFACE STATES IN MOS DEVICES
    KJAR, RA
    NICHOLS, DK
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, 22 (06) : 2193 - 2196
  • [23] DIFFERENTIAL CALORIMETER FOR RADIATION-INDUCED POWER
    LEWIS, WB
    NUCLEAR SCIENCE AND ENGINEERING, 1964, 18 (01) : 1 - &
  • [24] ELECTRONIC METHODS FOR REGISTRATION OF RADIATION-INDUCED REACTIONS
    SCHWARZE, H
    WOLSCHENDORF, K
    ATOMKERNENERGIE, 1974, 23 (01): : 19 - 22
  • [25] Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic Devices
    Li, Qi
    Wang, Lingfeng
    Hou, Shiying
    2018 2ND IEEE CONFERENCE ON ENERGY INTERNET AND ENERGY SYSTEM INTEGRATION (EI2), 2018,
  • [26] Simulated galactic cosmic radiation-induced cancer progression in mice
    Luitel, Krishna
    Siteni, Silvia
    Barron, Summer
    Shay, Jerry W.
    LIFE SCIENCES IN SPACE RESEARCH, 2024, 41 : 43 - 51
  • [27] Modern Power Electronic Devices: Physics, applications, and reliability
    Silva, Fernando A.
    Kazmierkowski, Marian P.
    IEEE INDUSTRIAL ELECTRONICS MAGAZINE, 2021, 15 (03) : 73 - 74
  • [28] Challenges and New Trends in Power Electronic Devices Reliability
    Chiodo, Elio
    De Falco, Pasquale
    Di Noia, Luigi Pio
    ELECTRONICS, 2021, 10 (08)
  • [29] Estrogen Protects against Radiation-Induced Cataractogenesis
    Dynlacht, Joseph R.
    Valluri, Shallaja
    Lopez, Jennifer
    Greer, Falon
    DesRosiers, Colleen
    Caperell-Grant, Andrea
    Mendonca, Marc S.
    Bigsby, Robert M.
    RADIATION RESEARCH, 2008, 170 (06) : 758 - 764
  • [30] ELECTRON TRAPPING BY RADIATION-INDUCED CHARGE IN MOS DEVICES
    AITKEN, JM
    YOUNG, DR
    JOURNAL OF APPLIED PHYSICS, 1976, 47 (03) : 1196 - 1198
12345