Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging

被引：0

作者：

Spataru, Sergiu ^{[1
]}

Hacke, Peter ^{[2
]}

Sera, Dezso ^{[1
]}

Glick, Stephen ^{[2
]}

Kerekes, Tamas ^{[1
]}

Teodorescu, Remus ^{[1
]}

机构：

[1] Aalborg Univ, DK-9220 Aalborg, Denmark

[2] Natl Renewable Energy Lab, Golden, CO 80401 USA

来源：

2015 IEEE 42ND PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC) | 2015年

关键词：

crystalline silicon; cell cracks; diagnosis; electroluminescence; photovoltaic module;

D O I：

暂无

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

This article proposes a method for quantifying the percentage of partially and totally disconnected solar cell cracks by analyzing electroluminescence images of the photovoltaic module taken under high-and low-current forward bias. The method is based on the analysis of the module's electroluminescence intensity distribution, applied at module and cell level. These concepts are demonstrated on a crystalline silicon photovoltaic module that was subjected to several rounds of mechanical loading and humidity-freeze cycling, causing increasing levels of solar cell cracks. The proposed method can be used as a diagnostic tool to rate cell damage or quality of modules after transportation. Moreover, the method can be automated and used in quality control for module manufacturers, installers, or as a diagnostic tool by plant operators and diagnostic service providers.

引用

页数：6

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