On-line testing of computing circuits at performance of the approximate calculations

被引：0

作者：

Drozd, A ^{[1
]}

Lobachev, M ^{[1
]}

机构：

[1] Odessa Natl Polytech Univ, UA-65044 Odessa, Ukraine

来源：

MODERN PROBLEMS OF RADIO ENGINEERING, TELECOMMUNICATIONS AND COMPUTER SCIENCE, PROCEEDINGS | 2004年

关键词：

on-line testing; checking; reliability of results; computing circuits; approximate calculations;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper features of on-line testing for computing circuits at approximated data processing are considered. Checking reliability of the approximated results for arithmetic operations is estimated. The low reliability of traditional checking methods caused by rejection of authentic results is shown. Ways to decrease the rejection probability of authentic results are determined using the truncated arithmetic operations and methods of checking with low detection probability of errors, which are unessential to reliability of result.

引用

页码：555 / 556

页数：2

共 50 条

[1] A RESOURCE APPROACH TO ON-LINE TESTING OF COMPUTING CIRCUITS
Drozd, J.
Drozd, A.
Al-dhabi, M.
[J]. PROCEEDINGS OF 2015 IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS), 2015,
[2] The logarithmic checking method for on-line testing of computing circuits for processing of the approximated data
Drozd, A
Al-Azzeh, R
Drozd, J
Lobachev, M
[J]. PROCEEDINGS OF THE EUROMICRO SYSTEMS ON DIGITAL SYSTEM DESIGN, 2004, : 416 - 423
[3] On-line testing of globally asynchronous circuits
Shang, D
Bystrov, A
Yakovlev, A
Koppad, D
[J]. 11TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, 2005, : 135 - 140
[4] Low cost on-line testing of RF circuits
Negreiros, M
Carro, L
Susin, AA
[J]. 10TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS, 2004, : 73 - 78
[5] Recovery during concurrent on-line testing of identical circuits
Pomeranz, I
Reddy, SM
[J]. DFT 2005: 20TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, 2005, : 475 - 483
[6] On-line Testing for Differential Fault Attacks in Cryptographic Circuits
Mukhopadhyay, Debdeep
[J]. PROCEEDINGS OF THE 2013 IEEE 19TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS), 2013, : 226 - 227
[7] ADOLT - An ADaptable On-Line Testing scheme for VLSI circuits
Maamar, A
Russell, G
[J]. DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS, 1999, : 770 - 771
[8] Low Cost On-Line Testing Strategy for RF Circuits
Marcelo Negreiros
Luigi Carro
Altamiro A. Susin
[J]. Journal of Electronic Testing, 2005, 21 : 417 - 427
[9] Adaptive BIST for Concurrent On-Line Testing on Combinational Circuits
Chioktour, Vasileios
Kakarountas, Athanasios
[J]. ELECTRONICS, 2022, 11 (19)
[10] On-line testing field programmable analog array circuits
Wang, HB
Kulkarni, S
Tragoudas, S
[J]. INTERNATIONAL TEST CONFERENCE 2004, PROCEEDINGS, 2004, : 1340 - 1348

← 1 2 3 4 5 →