Computational techniques to incorporate shot count reduction into inverse lithography

被引:0
|
作者
Wu, Xiaofei [1 ]
Liu, Shiyuan [2 ]
Lam, Edmund Y. [1 ]
机构
[1] Univ Hong Kong, Dept Elect & Elect Engn, Imaging Syst Lab, Pokfulam, Hong Kong, Peoples R China
[2] Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan, Peoples R China
关键词
MASK OPTIMIZATION;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We develop an inverse lithography method to tackle the shot count minimization in mask fracturing. The shot count minimization in model based fracturing is considered as a problem of finding a sparse combination of basis functions for the mask patterns, where the basis functions are defined as rectangles corresponding to the shots. This problem is formulated as a nonlinear least square problem, and a Gauss-Newton algorithm is proposed to solve it. The algorithm is modified to promote sparsity to reduce the shot count. Preliminary results of mask fracturing using the proposed algorithm is shown, and it is also incorporated into inverse lithography to show its effectiveness to reduce shot count.
引用
收藏
页数:3
相关论文
共 50 条
  • [21] COMPUTATIONAL COMPLEXITY REDUCTION TECHNIQUES FOR QUADRATURE KALMAN FILTERS
    Closas, Pau
    Vila-Valls, Jordi
    Fernandez-Prades, Carles
    2015 IEEE 6TH INTERNATIONAL WORKSHOP ON COMPUTATIONAL ADVANCES IN MULTI-SENSOR ADAPTIVE PROCESSING (CAMSAP), 2015, : 485 - 488
  • [22] Improving 130 nm Node Patterning Using Inverse Lithography Techniques For An Analog Process
    Duan, Can
    Jessen, Scott
    Ziger, David
    Watanabe, Mizuki
    Prins, Steve
    Ho, Chi-Chien
    Shu, Jing
    OPTICAL MICROLITHOGRAPHY XXXI, 2018, 10587
  • [23] Improving computational efficiency in LCM by using computational geometry and model reduction techniques
    Cueto, Elias
    Ghnatios, Chady
    Chinesta, Francisco
    Montes, Nicolas
    Sanchez, Fernando
    Falco, Antonio
    MATERIAL FORMING ESAFORM 2014, 2014, 611-612 : 339 - 343
  • [24] Stitching-error reduction in gratings by shot-shifted electron-beam lithography
    Dougherty, DJ
    Muller, RE
    Maker, PD
    Forouhar, S
    JOURNAL OF LIGHTWAVE TECHNOLOGY, 2001, 19 (10) : 1527 - 1531
  • [25] Recent progress on computational inverse techniques in non-destructive evaluation
    Liu, GR
    Han, X
    COMPUTATIONAL FLUID AND SOLID MECHANICS 2003, VOLS 1 AND 2, PROCEEDINGS, 2003, : 418 - 421
  • [26] A Highly Effective and Efficient Cost-Function-Reduction Method for Inverse Lithography Technique
    Zhang, Jinyu
    Tsai, Min-Chun
    Xiong, Wei
    Wang, Yan
    Yu, Zhiping
    SISPAD: 2008 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, 2008, : 257 - +
  • [27] Cost Effective Application Of Advanced Computational Lithography Techniques Using Flexible Mask Optimization
    Chua, Gek Soon
    Zou, Yi
    Wang, Wei-Long
    Yang, Qing
    Quek, Shyue Fong
    Qiu, Jianhong
    Pandey, Taksh
    Baron, Stanislas
    Kapasi, Sanjay
    Dover, Russell
    Zhang, Xiaolong
    Yan, Bo
    2013 24TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2013, : 1 - 6
  • [28] COMPUTATIONAL TECHNIQUES FOR INVERSE PROBLEMS IN SIZE STRUCTURED STOCHASTIC POPULATION-MODELS
    BANKS, HT
    LECTURE NOTES IN CONTROL AND INFORMATION SCIENCES, 1989, 114 : 3 - 10
  • [29] EUV mask Absorber and Multi-layer Defect disposition techniques using Computational Lithography
    Tolani, Vikram
    Satake, Masaki
    Hu, Peter
    Peng, Danping
    Li, Ying
    Kim, David
    Pang, Linyong
    PHOTOMASK TECHNOLOGY 2011, 2011, 8166
  • [30] Inverse design of photonic nanostructures using dimensionality reduction: reducing the computational complexity
    Zandehshahvar, Mohammadreza
    Kiarashi, Yashar
    Chen, Michael
    Barton, Reid
    Adibi, Ali
    OPTICS LETTERS, 2021, 46 (11) : 2634 - 2637