Measurements of electron temperature in high-energy-density plasmas using gated x-ray pinhole imaging

被引：2
|
作者：
Schaeffer, D. B. [1 ]
Fox, W. [1 ,2 ]
Rosenberg, M. J. [3 ]
Park, H-S [4 ]
Fiksel, G. [5 ]
Kalantar, D. [4 ]
机构：
[1] Princeton Univ, Dept Astrophys Sci, Princeton, NJ 08540 USA
[2] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA
[3] Univ Rochester, Lab Laser Energet, Rochester, NY 14623 USA
[4] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[5] Univ Michigan, Ctr Ultrafast Opt Sci, Ann Arbor, MI 48109 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2021年 / 92卷 / 04期
关键词：
Bremsstrahlung x-rays - Filter materials - High energy density plasmas - Measurements of - Pinhole imaging - Plasma plumes - Spatially resolved - Temporally resolved;
D O I：
10.1063/5.0043833
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We present measurements of spatially and temporally resolved electron temperature in high-energy-density plasmas using gated x-ray pinhole imagers. A 2D image of bremsstrahlung x-ray self-emission from laser-driven plasma plumes is detected at the same time through two pinholes covered with different filter materials. By comparing the attenuated signal through each filter, a spatially resolved electron temperature as low as 0.1 keV can be estimated. Measurements of the plasma plume taken from different directions indicate that imaging through extended plasmas has a negligible effect on the temperature estimates. Methods for estimating the expected signal, selecting filters, and incorporating the response of the detector are discussed.
引用
收藏
页数：5
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