Application of surface antireflection treating in infrared thermal wave nondestructive testing

被引：0

作者：

Duan Yu-xia ^{[1
]}

Jin Wan-ping ^{[1
]}

Zhang Cun-lin ^{[1
]}

机构：

[1] Capital Normal Univ, Dept Phys, 105 W Sanhuan N Rd, Beijing 100037, Peoples R China

来源：

CONFERENCE DIGEST OF THE 2006 JOINT 31ST INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 14TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS | 2006年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The application of surface antireflection technique in infrared thermal wave nondestructive testing is presented. The method for covering antireflection membrane on the specimen surface by vacuum-pumping has been tested. The experimental results show that this technique is effective for enhancing sample surface absorption and emissivity, moreover, it does not stain or damage the specimen.

引用

页码：322 / 322

页数：1

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