Application of surface antireflection treating in infrared thermal wave nondestructive testing

被引：0
|
作者：
Duan Yu-xia [1 ]
Jin Wan-ping [1 ]
Zhang Cun-lin [1 ]
机构：
[1] Capital Normal Univ, Dept Phys, 105 W Sanhuan N Rd, Beijing 100037, Peoples R China
来源：
CONFERENCE DIGEST OF THE 2006 JOINT 31ST INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 14TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS | 2006年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The application of surface antireflection technique in infrared thermal wave nondestructive testing is presented. The method for covering antireflection membrane on the specimen surface by vacuum-pumping has been tested. The experimental results show that this technique is effective for enhancing sample surface absorption and emissivity, moreover, it does not stain or damage the specimen.
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页码：322 / 322
页数：1
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