X-ray microdiffraction for the analysis of bearing operation conditions

被引:0
|
作者
Vegter, Reinder H. [1 ]
Verschoor, Hans A. [1 ]
Girones, Anna [1 ]
机构
[1] SKF Engn & Res Ctr, Kelvinbaann 16, NL-3439 MT Nieuwegein, Netherlands
关键词
X-ray diffraction; bearing steel;
D O I
10.1520/STP41655S
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
The use of residual stress measurements for the analysis of the performance of rolling bearings has become a common tool in the bearing industry. The effects of rolling contact fatigue on the development of residual stresses in the loaded zones of a bearing has been investigated in much detail. In this paper, the developments of the use of X-ray microdiffraction for residual stress measurements in bearings will be described. In microdiffraction, measurements are performed with very small irradiated spots. Advances in X-ray diffraction technology have made it possible to determine the residual stresses in loaded components in small areas with a high level of detail. The method and its consequences for bearing analysis is discussed in this paper. Using the method, much more information on the exact operation conditions of a bearing can be extracted from the components compared to conventional X-ray diffraction methods. Residual stress measurements using microdiffraction have been successfully applied in an application analysis case, where the measurements were used to show the residual stress development in the bearing surface during operation. In such a case, microdiffraction could also be used to investigate local bearing life limiting features, such as surface damages.
引用
收藏
页码:227 / +
页数:2
相关论文
共 50 条
  • [41] X-ray microdiffraction characterization of deformation heterogeneities in BCC crystals
    Magid, KR
    Lilleodden, ET
    Tamura, N
    Florando, JN
    Lassila, DH
    LeBlanc, MM
    Barabash, RI
    Morris, JW
    Neutron and X-Ray Scattering as Probes of Multiscale Phenomena, 2005, 840 : 181 - 186
  • [42] Recent developments in white and monochromatic x-ray microdiffraction.
    Gergaud, P.
    Bleuet, P.
    Villanova, J.
    Sicardy, O.
    Lamontagne, P.
    Arnaud, L.
    Robach, O.
    Micha, J. S.
    Ulrich, O.
    Biquard, X.
    Rieutord, F.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2010, 66 : S100 - S101
  • [43] A superbend X-ray microdiffraction beamline at the advanced light source
    Tamura, N.
    Kunz, M.
    Chen, K.
    Celestre, R. S.
    MacDowell, A. A.
    Warwick, T.
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2009, 524 (1-2): : 28 - 32
  • [44] Visrock:: a program for digital topography and X-ray microdiffraction imaging
    Luebbert, Daniel
    Baumbach, Tilo
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2007, 40 : 595 - 597
  • [45] Synchrotron X-ray microdiffraction (μXRD) in minerals and environmental research
    Graefe, Markus
    Klauber, Craig
    Gan, Bee
    Tappero, Ryan V.
    POWDER DIFFRACTION, 2014, 29 : S64 - S72
  • [46] Microdiffraction coupled with X-ray fluorescence microprobe, application in archaeometry
    Dillmann, P
    Populus, P
    Chevallier, P
    Fluzin, P
    Beranger, G
    Firsov, A
    JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, 1997, 15 (03): : 251 - 262
  • [47] Design and performance of x-ray optics optimized for polycrystalline microdiffraction
    Ice, GE
    Chung, JS
    Larson, BC
    Budai, JD
    Tischler, JZ
    Tamura, N
    Lowe, W
    SYNCHROTRON RADIATION INSTRUMENTATION, 2000, 521 : 19 - 24
  • [48] X-ray Microdiffraction on Individual Self-Assembled Nanostructures
    Mocuta, C.
    Krause, B.
    Mundboth, R.
    Metzger, T. H.
    Stangl, J.
    Bauer, G.
    Vartanyants, I.
    Deneke, C.
    Schmidt, O. G.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2007, 63 : S89 - S89
  • [49] High Brilliance X-ray Laboratory System for Microdiffraction Studies
    Mikhin, Oleg. V.
    Ozerov, Victor S.
    Priladyshev, Alexey V.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2005, 61 : C141 - C142
  • [50] X-ray microdiffraction on flow-controlled biomolecular assemblies
    Evans, H. M.
    Dootz, R.
    Koester, S.
    Struth, B.
    Pfohl, T.
    BULLETIN OF THE POLISH ACADEMY OF SCIENCES-TECHNICAL SCIENCES, 2007, 55 (02) : 217 - 227