Raman scattering as a diagnostic tool of semiconductor nanofabrication

被引：0
|
作者：
Torres, CMS [1 ]
机构：
[1] Berg Univ Gesamthsch Wuppertal, Inst Mat Sci, D-42097 Wuppertal, Germany
来源：
OPTICAL SPECTROSCOPY OF LOW DIMENSIONAL SEMICONDUCTORS | 1997年 / 344卷
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D O I：
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中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
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页码：331 / 354
页数：24
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