Combined continuous lot by lot acceptance sampling plan

被引：4
|
作者：
Govindaraju, K [1 ]
Bebbington, M [1 ]
机构：
[1] Massey Univ, Inst Informat Sci & Technol, Palmerston North, New Zealand
来源：
JOURNAL OF APPLIED STATISTICS | 2000年 / 27卷 / 06期
关键词：
D O I：
10.1080/02664760050081906
中图分类号：
O21 [概率论与数理统计]; C8 [统计学];
学科分类号：
020208 ; 070103 ; 0714 ;
摘要：
For production processes involving low fraction non-conforming, the sample sizes of the usual attribute inspection plans are very large. A continuous sampling plan for such processes would also require either a large clearance interval or a large sampling fraction. This paper simplifies the approach of combining the lot by lot and continuous sampling plans recommended by Pesotchinsky (1987) and provides various performance measures for the combined plan. A discussion of the choice of the parameters is also given.
引用
收藏
页码：725 / 730
页数：6
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