Reduction of electronic noise in THz generation

被引：2

作者：

Wetzels, A ^{[1
]}

Gürtler, A ^{[1
]}

Buijserd, A ^{[1
]}

Vijftigschild, T ^{[1
]}

ter Horst, H ^{[1
]}

van der Zande, WJ ^{[1
]}

机构：

[1] FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2003年 / 74卷 / 06期

关键词：

D O I：

10.1063/1.1574606

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The generation of half-cycle pulses, using laser illumination with femtosecond pulses of a biased GaAs wafer, induces strong electronic noise. We found that electronic noise can be significantly reduced by mounting an RC circuit directly on the semiconductor wafer. (C) 2003 American Institute of Physics.

引用

页码：3180 / 3181

页数：2

共 50 条

[21] Generation and Stabilization of THz-waves with Extraordinary Low Line Width and Phase Noise
Preussler, Stefan
Al-Taiy, Hassanain
Schneider, Thomas
2015 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2015,
[22] Electronic and allosteric regulation of nitrite reduction and NO generation by deoxyhemoglobin
Huang, Z
Shiva, S
Schechter, A
Ringwood, L
Irby, C
Cushenberry, C
Grand, P
Patel, R
Kim-Shapiro, D
Hogg, N
Gladwin, M
FREE RADICAL BIOLOGY AND MEDICINE, 2004, 37 : S20 - S21
[23] THz generation in InAs
Lewis, RA
Smith, ML
Mendis, R
Vickers, REM
PHYSICA B-CONDENSED MATTER, 2006, 376 : 618 - 621
[24] Photon-Counting CT Binning and Electronic Noise Reduction
Wininger, Kevin L.
RADIOLOGIC TECHNOLOGY, 2024, 95 (04) : 276 - 279
[25] Electronic stability and noise reduction in Doppler broadening spectroscopy systems
Ching, HM
Zhang, JD
Beling, CD
Fung, S
APPLIED SURFACE SCIENCE, 2002, 194 (1-4) : 250 - 254
[26] Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices
Colomes, Enrique
Mateos, Javier
Gonzalez, Tomas
Oriols, Xavier
SCIENTIFIC REPORTS, 2020, 10 (01)
[27] Possible generation of transient THz electronic drift effects in a semiconductor by a high electric field
Filip, VM
Plavitu, CN
JOURNAL DE PHYSIQUE I, 1996, 6 (03): : 403 - 412
[28] Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices
Enrique Colomés
Javier Mateos
Tomás González
Xavier Oriols
Scientific Reports, 10
[29] Noise in THz detectors and generators
Handel, Peter H.
Hall, Amanda M.
Tournier, Adam G.
TERAHERTZ FOR MILITARY AND SECURITY APPLICATIONS IV, 2006, 6212
[30] Research on Noise Generation Mechanism and Noise Reduction Ball Valve Measures of Ball Valve
Zhang, Jin
Yang, Qifan
Lv, Ruiqi
Liu, Baolei
Li, Ying
IEEE ACCESS, 2020, 8 (15973-15982) : 15973 - 15982

← 1 2 3 4 5 →